Current-transport mechanisms in the Au/GaSe:Nd Schottky contact
      
Yazarlar (4)
Prof. Dr. Hüseyin ERTAP Kafkas Üniversitesi, Türkiye
Hatice Kaçuş Atatürk Üniversitesi, Türkiye
Şakir Aydoğan Atatürk Üniversitesi, Türkiye
Mevlüt Karabulut Gebze Teknik Üniversitesi, Türkiye
Makale Türü Özgün Makale (SSCI, AHCI, SCI, SCI-Exp dergilerinde yayınlanan tam makale)
Dergi Adı Journal of Materials Science Materials in Electronics
Dergi ISSN 0957-4522 Wos Dergi Scopus Dergi
Dergi Tarandığı Indeksler SCI-Expanded
Makale Dili İngilizce Basım Tarihi 04-2020
Cilt / Sayı / Sayfa 31 / 7 / 5198–5204 DOI 10.1007/s10854-020-03079-2
Makale Linki http://link.springer.com/10.1007/s10854-020-03079-2
Özet
Structural and electrical features of p-type neodymium-doped GaSe single crystal (0.1 at.% Nd) grown by modified Bridgman technique was investigated through X-ray diffraction (XRD) and current–voltage (I–V) measurements. The XRD spectrum reveals that GaSe:Nd single crystal investigated has hexagonal structure (a = 3.750 Å, c = 15.950 Å and z = 4, P63/mmc space group) with preferred orientation along (004). Ohmic contact was realized by evaporating indium (In) on one surface of the GaSe:Nd single crystal at 10–6 Torr while Shottky contact was obtained by evaporating twelve Au dot contacts with 7.85 × 10–3 cm2 area on the other surface of the crystal. The I–V characteristics of Au/GaSe:Nd/In Schottky contact was analysed in the 100–360 K temperature range. The main Schottky diode parameters such as ideality factor, barrier height and the series resistance values were determined as a function of temperature using conventional I–V method and Norde method. The ideality factor n of the Au/GaSe:Nd/In Schottky contact was observed to decrease while the barrier height Φ b increased with increasing temperature. Temperature dependence of the diode parameters were attributed to the existence of barrier height inhomogeneity by assuming a Gaussian distribution of Au/GaSe:Nd/In Schottky contact.
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