| Yazarlar |
Hüseyin ERTAP
Kafkas Üniversitesi, Türkiye |
Tarık Baydar
Türkiye |
|
Mustafa Yüksek
Kafkas Üniversitesi, Türkiye |
|
Mevlüt Karabulut
Gebze Teknik Üniversitesi, Türkiye |
| Özet |
| Structural, morphological, and optical properties of gallium sulfide film grown by chemical bath deposition have been investigated by XRD, SEM, AFM, and optical absorption techniques. The XRD spectrum indicated that the gallium sulfide film grew in crystalline form and the phase was identified as GaS. Gallium sulfide film had an island-like structure with a random distribution on a glass substrate. The particle size of the crystallites and surface roughness of the film were found to be 28-48 nm and 11.84 nm, respectively. The direct and indirect band gaps of gallium sulfide thin film were calculated from the absorption spectra as 2.76 and 2.10 eV, respectively. |
| Anahtar Kelimeler |
| Gallium sulfide | chemical bath deposition technique | XRD | SEM | AFM |
| Makale Türü | Özgün Makale |
| Makale Alt Türü | Ulusal alan endekslerinde (TR Dizin, ULAKBİM) yayımlanan tam makale |
| Dergi Adı | TURKISH JOURNAL OF PHYSICS |
| Dergi ISSN | 1300-0101 |
| Dergi Tarandığı Indeksler | TR DİZİN |
| Makale Dili | Türkçe |
| Basım Tarihi | 01-2016 |
| Cilt No | 40 |
| Sayı | 3 |
| Sayfalar | 297 / 303 |
| Doi Numarası | 10.3906/fiz-1604-14 |
| Makale Linki | http://online.journals.tubitak.gov.tr/openDoiPdf.htm?mKodu=fiz-1604-14 |
| Atıf Sayıları | |
| WoS | 9 |
| SCOPUS | 10 |
| TRDizin | 2 |
| Google Scholar | 17 |
