Wavelet phase evaluation of white light interferograms
Yazarlar (4)
Prof. Dr. Zehra Saraç Gebze Teknik Üniversitesi, Türkiye
Prof. Dr. Ali Dursun Gebze Teknik Üniversitesi, Türkiye
Prof. Dr. Sündüs YERDELEN Kafkas Üniversitesi, Türkiye
F. Necati Ecevit
Gebze Teknik Üniversitesi, Türkiye
Makale Türü Özgün Makale (SSCI, AHCI, SCI, SCI-Exp dergilerinde yayınlanan tam makale)
Dergi Adı Measurement Science and Technology (Q1)
Dergi ISSN 0957-0233 Wos Dergi Scopus Dergi
Dergi Tarandığı Indeksler SCI-Expanded
Makale Dili İngilizce Basım Tarihi 09-2005
Cilt / Sayı / Sayfa 16 / 9 / 1878–1882 DOI 10.1088/0957-0233/16/9/021
Makale Linki http://stacks.iop.org/0957-0233/16/i=9/a=021?key=crossref.9ef46299d7641c359bdf2048930dc29d
UAK Araştırma Alanları
Fen Bilgisi Eğitimi
Özet
The surface profile of a rough object is obtained by white light interferometry. The real and noisy simulated correlograms are analysed by using sliding average, continuous wavelet transform and a new algorithm that is called the continuous wavelet transform phase method. Measurement repeatability is calculated for each algorithm and it has been shown that the continuous wavelet transform phase method gives a smaller peak to valley value and standard deviation than other methods. Hence, this algorithm can be used to obtain a good repeatability or standard deviation in white light interferometry.
Anahtar Kelimeler
Repeatability | Wavelet transform | White light interferometry
Science Direct
BM Sürdürülebilir Kalkınma Amaçları
Atıf Sayıları
Web of Science 10
Scopus 11
Google Scholar 17
Wavelet phase evaluation of white light interferograms

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